Charging effect induced by electron beam irradiation: a review
Abstract
Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Integrated Circuits and Semiconductor Failure Analysis · Semiconductor materials and devices
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Affiliations
Department of Physics and Hefei National Laboratory for Physical Sciences at Microscale, University of Science and Technology of China, Hefei, People’s Republic of China
Research and Services Division of Materials Data and Integrated System, National Institute for Materials Science, Tsukuba, Japan
Research Center for Advanced Measurement and Characterization, National Institute for Materials Science, Tsukuba, Japan
Research Center for Functional Materials, National Institute for Materials Science, Tsukuba, Japan
Funding
National Key Research and Development Project · Education Ministry through ‘111 Project 2.0’ · JSPS KAKENHI · Basic Science Research Projects from The Sumitomo Foundation