Diffractometry of wire-drawing dies with local flaws
Source abstract
Abstract
The problem of measurement of flaw dimensions in diamond wire-drawing dies is discussed. An analytical expression for the modulation depth of diffraction rings as a function of the flaw dimension is given, and analytical calculations are compared to numerical calculations for various types of flaws. Changes in the symmetry of the diffraction pattern due to a local flaw on the hole surface are described.
Source: openaire · Quality: candidate unverified · Source record ↗
Research context
OpenAlex topics: Metallurgy and Material Forming · Metal Forming Simulation Techniques · Metal Alloys Wear and Properties
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (10)
Show source-provided references
1. Evseenko, N.I., Kozachok, A.G., and Solodkin, Yu.N., Analysis of Diffraction Techniques Used in Measuring Linear Dimensions,Metrologiya, 1984, no. 2, pp. 17–23.
2. Krylov, K.I., Prokopenko, V.T., and Mitrofanov, A.S.,Primenenie lazerov v mashinostroenii i priborostroenii (Application of Lasers to Construction of Machines and Instruments), Leningrad: Mashinostroenie, 1978.
3. Zvonarev, S.L., Kiiko, V.V., Naumova, V.L., and Tarlykov, V.A., Features of Diffraction Measurements of Linear Dimensions of Isolated Microelectronics Elements,Izmeritel’naya Tekhnika, 1989, no. 11, pp. 42–43.
4. Khanonkinet al., Techniques for Measuring Dimensions of Diamond Wire-Drawing Dies, inAlmazy i sverkhtverdye materialy (Diamonds and Superhard Materials), Moscow: Sci.-Research Inst. of Mach. Building, 1981, issue 1, pp. 4–8.
5. Zaitsev, V.A., Zvonarev, S.L., Zelikson, G.A., Kiiko, V.V., Klyuev, Yu.A., Tarlykov, V.A., and Kheifets, M.F., Diffraction Monitoring of Channel Shape in Diamond Wire-Drawing Dies, inSb. Nauchykh Trudov VNIIalmaz (Proc. of Diamond Research Institute), Moscow: All-Union Sci.-Research Unst., 1990, pp. 69–75.
6. Tarlykov, V.A. and Kiiko, V.V., Diffractometry of Microscopic Orifices with Local Flaws,Defektoskopiya, 1988, no. 11, pp. 16–21.
7. Zvonarev, S.L. and Tarlykov, V.A., Structure of Diffraction Pattern Due to a Round Orifice with a Local Flaw,Avtometriya, 1995, no. 2, pp. 33–38.
8. Gekht, E., Symmetry Properties of Fraunhofer Diffraction Patterns,Usp. Fiz. Nauk, 199?, vol. 111, no. 2, pp. 355–364.
9. Durnev, V.D. and Talyshkevich, I.P.,Simmetriya v tekhnologii (Symmetry in Technology), St. Petersburg: Politekhnika, 1993.
10. Papoulis, A.,Theory of Systems and Transforms in Optics, Translated under the titleTeoriya sistem i preobrazovanii v optike, Moscow: Mir, 1971.