Nondestructive testing of the thermal resistance of Gann diodes during their manufacture
Source abstract
Abstract
The results of an investigation of the thermal resistance of Gunn diodes at different process technology cycles of their manufacturing are considered.
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Thermography and Photoacoustic Techniques · Welding Techniques and Residual Stresses · Induction Heating and Inverter Technology
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References (6)
Show source-provided references
1. Yurchenko, V.I. and Kupryakov, V.I., A Setup for Measuring Thermal Resistance, Release Bulletin, ser. ILKIA, May13,1982, no. 82-1150.
2. Yurchenko, V.I., Shcherbakov, V.L., and Smagin, A.A., Testing of Thermal Resistance for Evaluating the Degradation of Gunn Diodes, Programma vtorogo simpoziuma “Effekt Ganna i ego primenenie” (Program of the Second Symposium “Gunn Effect and Its Application”), Novosibirsk, 1982, p. 6.
3. Kupryakov, V.I., Brichanskii, V.G., and Yurchenko, V.I., USSR Inventor’s Certificate no. 1245093, 1986.
4. Yurchenko, V.I., Investigation of Ultrasonic Microwelding of Gunn Diode Crystals Using Thermal Resistance Measurements, Elektron.Tekh. Ser. 2. Poluprovod. Prib., 1986, no. 5, pp. 101–104.
5. Yurchenko, V.I., Methods and Setups for Measuring the Thermal Resistance of Gunn Diodes, Elektron. Promysh., 2002, nos. 2–3, pp. 179–180.
6. Polisadov, S.N., Smagin, A.A., Shapoval, L.G., and Yurchenko, V.I., USSR Inventor’s Certificate no. 705390, 1979.