journal article·2004-02

How to Test Better

Yu. G. Vasenev

Publisher page

Abstract

Practical examples for optimization of nondestructive testing of various objects are presented.
The source flagged this abstract for review. Check formulas and completeness against the original publication.
Source: openaire · Quality: needs review · Source record ↗
Source flags: short_text

Research context

OpenAlex topics: VLSI and Analog Circuit Testing · Non-Destructive Testing Techniques

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

References

Reference metadata was not supplied for this record.