Identification of chemical composition of objects probed by x-rays based on spectral analysis of transmitted radiation
Source abstract
Abstract
Procedures for identification of one- and two-component objects based on the spectral analysis of transmitted x-rays are discussed, and selection rules for hypotheses are formulated. A possibility of extending such procedures to more complex objects is demonstrated. An integral characteristic Zeff of materials has been introduced and related to the atomic number Z for elemental materials. The selectivity of the identification procedure based on parameter Zeff, which relates object and apparatus characteristics, and measurement errors, has been estimated. The required spectral selectivity of detection channels has been estimated, and the feasibility of the technique has been proven.
Source: openaire · Quality: candidate unverified · Source record ↗
Research context
OpenAlex topics: Advanced X-ray and CT Imaging · Radiation Dose and Imaging · Digital Radiography and Breast Imaging
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (10)
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