The effect of the regime of recording diffractograms on the profile and width of instrumental lines
Source abstract
Abstract
The influence of the operating mode of an X-ray diffractometer on the profile and integral width of instrumental lines was investigated. It was shown that the choice of a function for the best approximation of the instrumental line depends on an angular range of recording. The best approximation functions in different angular ranges were determined. It was shown that the main effect on the instrumental line width is exerted by the dimensions of the input vertical divergence and receiving slits. The criterion of choice of the maximum size of the receiving slit for X-ray tubes with different sizes of the focal spots was experimentally substantiated.
Source: openalex_inverted_index · Quality: baseline
Research context
OpenAlex topics: X-ray Diffraction in Crystallography · Nuclear Physics and Applications · Geophysical Methods and Applications
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (14)
Show source-provided references
1. Kheiker, D.M. and Zevin, L.S., Rentgenovskaya difraktometriya (X-ray Diffractometry), Moscow: Fizmatgiz, 1963.
2. Lipson, G. and Steeple, G., Interpretation of X-ray Powder Diffraction Patterns, MacMillan, 1970.
3. Iveronova, V.I. and Revkevich, G.P., Teoriya rasseyaniya rentgenovskikh luchei (Theory of X-ray Scattering), Moscow: MGU, 1978.
4. Umanskii, Ya.S., Skakov, Yu.A., Ivanov, A.N., and Rastorguev, L.N., Kristallografiya, rentgenografiya i elektronnaya mikroskopiya: ucheb. dlya vuzov (Crystallography, Radiography, and Electron Microscopy: Manual for Institutes), Moscow: Metallurgiya, 1982.
5. Gorelik, S.S., Skakov, Yu.A., and Rastorguev, L.N., Rentgenograficheskii i elektronno-opticheskii analiz: ucheb. Posobie dlya vuzov (X-ray Radiographic and Electron-Optical Analysis: Manual for Higher School), Moscow: MISIS, 2002.
6. Gusev, A.I., Nanomaterialy, nanostruktury, nanotekhnologii. 2-e izd., ispr (Nanomaterials, Nanostructures, Nanotechnologies), Moscow: FIZMATLIT, 2009.
7. Krivoglaz, M.A., Difraktsiya rentgenovskikh luchei i neitronov v neideal’nykh kristallakh (Diffraction of X-Rays and Meutrons in Nonideal Crystals), Kiev: Naukova dumka, 1983.
8. Kitaigorodskii, A.I., Rentgenostrukturnyi analiz melkokristallicheskikh i amorfnykh tel (X-ray Structural Analysis of Small-Crystal and Amorphous Bodies)), Moscow: Gos. Izd. tekhniko-teoreticheskoi literatury, 1952.
9. Ida, T. and Toraya, H., Deconvolution of the Instrumental Functions in Powder X-Rays Diffractometer, J. Appl. Crystallogr., 2002, vol. 35, pp. 58–68.10.1107/S0021889801018945 ↗
10. Korchevskii, V.V., Application of Mathematical Simulation in Processing of the Results of X-Ray Diffractometric Studies, Elektron. Zh. “Issledovano v Rossii”, 2004, no 7, pp. 2612–2618. http,zhournal.ape.relran.ru/articles/2004, p. 244.
11. Cerňanský, M., Extrapolation Method of the Elimination of Instrumental Broadening of Diffraction Lines, Materials Structure, 2000, vol. 7, no. 1, pp. 3–5.
12. Kojdecki, M.A., Mielcarek, W., Procio-w, K., and Warycha, J., Comparison of Two Standards for Powder X-Ray Diffractometry, Zeischrift fur Kristallographie Supplement, 2009, no. 30, pp. 183–188.10.1524/zksu.2009.0026 ↗
13. Delhez, R., de Keijser, Th.H., and Mittemeijer, E.J., The X-Ray Diffraction Line Broadening due to the Diffractometer Condition as a Function of 2θ, J. Phys. E: Sci. Instr., 1978, vol. 11, no. 7, pp. 649–652.10.1088/0022-3735/11/7/015 ↗
14. Cheary, R.W. and Coelho, A., A Fundamental Parameters Approach to Line-Profile Fitting, J. Appl. Crystallogr., 1992, vol. 25, pp. 109–121.10.1107/S0021889891010804 ↗