OSL diagnostics of luminescent materials in a scanning electron microscope
Source abstract
Abstract
The principles for the application of methods of optically stimulated luminescence (OSL) in a scanning electron microscope (SEM) were developed in this work. A functional scheme for a diagnostic OSL attachment for the investigation of the local properties and distribution parameters of optically active structure complexes in wide-gap dosimeter materials was proposed. Analysis of the dependencies of OSL on the variation in the size of regions that are irradiated with electrons was conducted with anion-defective α-Al 2 O 3 singlecrystals as an example. The possibility of OSL diagnostics of the surface of solid luminescent media and functional matrices with a microscale spatial resolution was shown.
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Research context
OpenAlex topics: Luminescence Properties of Advanced Materials · Ion-surface interactions and analysis · Electron and X-Ray Spectroscopy Techniques
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (14)
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