The effect of x-ray radiation on the electrical parameters and low-frequency noise of digital integral schemes
Source abstract
Abstract
We consider the sensitivity of electrical parameters and low-frequency noise of digital integral schemes that are made using different technologies to X-ray radiation.
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Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Low-power high-performance VLSI design · Electromagnetic Compatibility and Noise Suppression · High voltage insulation and dielectric phenomena
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References (9)
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