Lifetime tests of structures with the use of microprocessor strain-gaging systems
Source abstract
Abstract
A technique for continuous strain gaging during lifetime tests of structures with the use of static strain-gaging systems is developed. The performed studies allowed automatic monitoring of the readings of strain gages and the analysis of the fall of these readings beyond the tolerable limits. When the readings of a strain gage exceed the tolerable value, the loading system is stopped automatically.
Source: openalex_inverted_index · Quality: baseline
Research context
OpenAlex topics: Sensor Technology and Measurement Systems · Engineering Diagnostics and Reliability · Material Properties and Applications
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References (4)
Show source-provided references
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2. Stepanova, L.N., Lebedev, E.Yu., Kabanov, S.I., et al., Multichannel Strain-Gaging Microprocessor System for Strength Measurements of Structures, Defektoskopiya, 2001, no. 4, p. 82 [Rus. J. of Nondestructive Testing (Engl. Transl.), 2001, vol. 37, no. 4, p. 306].10.1023/A:1012367308622 ↗
3. Stepanova, L.N., Lebedev, E.Yu., Kabanov, S.I., et al., Small-Scale Microprocessor Strain-Gaging System, Kontrol’. Diagnostika, 2002, no. 8, p. 41.
4. Stepanova, L.N., Kabanov, S.I., Lebedev, E.Yu., et al., High-Speed Microprocessor Strain-Gaging System for Dynamic Testing of Structures, Kontrol’. Diagnostika, 2006.