journal article·2010-08

The effect of structural flaws on the properties of the sapphire shell of a discharge radiation source

S. V. Gavrish

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Abstract

This paper is devoted to consideration of the key mechanisms of structural flaw formation in single-crystal sapphire tubes grown according to the method of A. V. Stepanov. The effects of solid and gaseous impurities and blocks on the optical properties and mechanical strength of the sapphire used as a shell in discharge lamps is investigated. Methods for improving the quality of sapphire tubes are proposed.
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Research context

OpenAlex topics: Laser Design and Applications · Material Properties and Applications · Engineering Technology and Methodologies

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References (6)

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1. Antonov, P.I., Zatulovsky, L.M., and Kostylyov, A.S., Poluchnie profilirovannykh monokristallov i izdelii metodom Stepanova (Manufacture of Profiled Single Crystals and Products Using the Stepanov Method), Leningrad: Nauka, 1971, p. 280.
2. Gavrish, S.V., Gaidukov, E.N., Konstantinov, B.A., et al., Discharge Sources of Infra-Red Radiation for Special Purposes, Svetotechnika, 1998, no. 3, pp. 22–24.
3. Gavrish, S.V., Gradov, V.M., and Terentyev, Yu.I., The Features of the Structure and Operation of Lamps with Sapphire Shells, Svetokhnika, 2008, no. 2, pp. 12–18.
4. Brailovsky, V.B., Gavrish, S.V., and Ryzhkov, A.E., Structural Defects and Diagnostics of the Corundum Profiled Single Crystal Tube Characteristics for Shells of IR Radiation Pulsed Discharge Lamps, Inspection. Diagnostics, 2007, no.2, pp. 49–59.
5. Lingart, Y.K., Petrov, B.A., and Tikhonova, N.A., Optical Properties of Leucosapphire at High Temperatures. Area of Translucency, TVT, 1982, vol.20, no. 5, pp. 872–880.
6. Brailovsky, V.B., Gaidukov E.N., Makarova T.V., et al., Mechanical Strength of Blockless Profiled Corundum Monocrystals, Elektron. Tekhn., 1991, no. 1, pp. 53–55.