A Practical and Precise Technique for Determination of Beta Emitter Source in Thickness Gauging of Thin Film
Source abstract
Abstract
Abstract The nuclear thickness gauging systems play an important role in the industry for invasive, online, and continuous measurements. The goal of the Beta thickness gauge is to obtain a precise measurement of thin films in which the performance of these gauging systems and output data quality are evaluated with the parameters including resolution, contrast, etc. The choice of the emitted suitable energy distribution of the Beta source is one of the effective factors in the system performance and precise measurement of thin films. In this research, a Beta thickness gauge with 147Pm and 85Kr sources was simulated and evaluated in biaxially oriented polypropylene sheet production lines in order to calculate the system performance due to Beta emitter sources with different energy distribution and select the suitable Beta emitter source. The relative error percentage, standard deviation, resolution, and contrast parameters for 147Pm energy distribution were calculated 1.413, 0.113, 0.007, and 0.008, respectively. Also, these parameters for 85Kr energy distribution were measured 2.750, 0.220, 0.014, and 0.001, respectively. The results reveal that the 147Pm energy distribution has superior in comparison with the 85Kr energy distribution for measuring of films or sheets with thin thickness.
Source: openalex_inverted_index · Quality: baseline
Research context
OpenAlex topics: Particle Detector Development and Performance · Electrostatic Discharge in Electronics · Integrated Circuits and Semiconductor Failure Analysis
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
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