The capabilities of multielectrode heterogeneous ionization chambers for X-ray thickness measurements
Source abstract
Abstract
An X-ray setup featuring automatic correction of the radiation spectrum and flux is developed for measuring the thickness of articles.
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced X-ray and CT Imaging · Nuclear Physics and Applications · Medical Imaging Techniques and Applications
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (6)
Show source-provided references
1. Nerazrushayushchii kontrol’i diagnostika (Nondestructive Testing and Diagnostics), Klyuev, V.V., Ed., Moscow: Mashinostroenie, 2005.
2. GOST (State Standard) 25858-83: Surface density and thickness measures for radioisotope thickness gauges. Specifications, 1983.
3. X-ray Technique for Measuring Thickness of Sheet Articles, RF Patent no. 2234677.
4. X-ray-Transparent Ionization Chamber, RF Patent no. 2194332.
5. Ionization Chamber, RF Patent no. 2194333.
6. Artem’ev, B.V., Maslov, A.I., Potapov, V.N., and Vedernikov, M.B., Use of X-Ray Thickness Gauges in Manufacturing Rolled Nonferrous Metals, Defektoskopiya, 2003, no. 6, pp. 55–62 [Rus. J. of Nondestructive Testing (Engl. Transl.), 2003, vol. 39, no. 6, p. 459].10.1023/B:RUNT.0000011627.14800.cb ↗