Quantitative proximate X-ray analysis of loose raw materials based on detection of diffraction and characteristic radiation
Source abstract
Abstract
A method of rapid X-ray analysis is proposed. The content of the method is that the ratio I d/I is measured in two channels of a γ spectrometer, one of which is configured for the diffraction maximum of the determined phase (I d) and the other measures the intensity of the spectral line of secondary element A (I ), the atomic number of which is the same as that of the material of the X-ray tube anode. Results of the X-ray analysis of chromite and molybdenum are presented. The test rate was 7 min per test. The maximum deviation from the content of MoS2 was 0.4% in standard specimens with concentrations of 24–29% and that of Fe and Cr2O3 was 0.3% for concentrations of 14–19%.
Source: openalex_inverted_index · Quality: baseline
Research context
OpenAlex topics: X-ray Diffraction in Crystallography · Welding Techniques and Residual Stresses · Material Properties and Failure Mechanisms
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References (4)
Show source-provided references
1. Rusakov, A.A., Rentgenografiya metallov (X-ray Diffraction Analysis of Metals), Moscow: Atomizdat, 1977.
2. Kochanov, N.N. and Mirkin, L.I., Rentgenostrukturnyi analiz (Prakticheskoe rukovodstvo) (X-ray Structural Analysis. Practical Manual), Moscow: Matgiz, 1960.
3. Leman, E.P., Rentgenoradiometricheskii metod oprobovaniya mestorozhdenii tsvetnykh i redkikh metallov (X-ray Radiometric Method of Testing Nonferrous and Rare-Metal Deposits), Leningrad: Nedra, 1973.
4. Umanskii, Ya.S., Rentgenografiya metallov i poluprovodnikov (X-ray Diffraction Studies of Metals and Semiconductors), Moscow: Metallurgiya, 1969.