journal article·1993-03

Remote field eddy current technique: Phantom exciter model calculations

D. L. Atherton, W. Czura

Publisher page

Abstract

Abstract High resolution results of finite element calculations for remote field eddy current “phantom exciter” simulations of slit defect interactions using single through wall transit are presented. These show that fine circumferential slits cause almost no field perturbations in the case of nonferromagnetic tubes but big perturbations in ferromagnetic tubes where high magnetic H fields occur in the slits. Defect-induced magnetic field perturbations must therefore be considered in addition to eddy current perturbations when ferromagnetic materials are inspected, particularly in the case of fine slits orthogonal to the magnetic field direction. Additional details seen are the funnelling of energy into slits in ferromagnetic pipes and precursor disturbances of fields approaching defects. It is suggested that these are due to the reflection of the electromagnetic waves dictates by boundary conditions at the near side defect boundary.
Source: openalex_inverted_index · Quality: baseline

Research context

OpenAlex topics: Non-Destructive Testing Techniques · Magnetic Properties and Applications · Hydrogen embrittlement and corrosion behaviors in metals

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

References (10)

Show source-provided references
1. T.R. Schmidt.Materials Evaluation 42225–230 (1984)
2. D.L. Atherton and S. Sullivan.Materials Evaluation 441544–1550 (1986)
3. W. Lord, Y.-S. Sun, S.S. Upda, and S. Nath.IEEE Trans. on Magnetics 24435–438 (1988)10.1109/20.43950 ↗
4. R. Palanisamy.J. Appl. Phys. 613202–3204 (1987)10.1063/1.338901 ↗
5. H. Hoshikawa, K. Koyama, J. Koido, and Y. Ishibashi.Materials Evaluation 4793–97 (1989)
6. Y.-S. Sun.Materials Evaluation 4787–92 (1989)
7. D.L. Atherton and W. Czura.Materials Evaluation,51:(in press)
8. B.J. Mergels, D.L. Atherton, and T.R. Schmidt.Proc. 1992 ASNT Fall Conference, Chicago.
9. B.J. Mergelas and D.L. Atherton.British J. Non-Destructive Testing,35:(in press)
10. D.L. Atherton and W. Czura.Electrosoft 2157–174 (1991)