journal article·1993-01

Proposal for Photothermal Characterization of Boundaries Between Layer and Substrate

K. Friedrich, U. Seidel, H. G. Walther, W. Karpen, G. Busse

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Abstract

Abstract The accurate measurement of frequency dependent photothermal phase angle curves allows the characterization of the boundary layer between substrate and coating. Regarding the measurable quantities phase extremum and the ratio of the abscissa for the zero crossing and the extremum we can classify the boundary type as a jump in material properties, as a delamination or as a diffusion zone between substrate and coating.
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Research context

OpenAlex topics: Thermography and Photoacoustic Techniques · Surface Roughness and Optical Measurements · Optical measurement and interference techniques

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References (10)

Show source-provided references
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6. Mandelis A. · J. Appl. Phys. · 1991 · 70 · 176110.1063/1.349517 ↗
7. Walther, H. G., Friedrich, K., Seidel, U., Karpen, W. and Busse, G. 1991. Proc. of 7th Int. Top. Meeting on Photoacoustic and Photothermal Phenomena. 1991, Doorwerth, The Netherlands.
8. Walther H. G. · Appl. Opt. · 1989 · 28 · 327510.1364/AO.28.003275 ↗
9. Jaarinen J. · J. Phys. (Paris) · 1983 · 44 · C6
10. Busse, G. 1989.Photoacoustic, Photothermal and Photochemical Processes at Surfaces and in Thin Films, Edited by: Hess, P. 251Berlin: Springer.10.1007/978-3-642-83945-0_9 ↗