journal article·1995-06

Dielectric and magnetic measurements: A survey of nondestructive, quasi-nondestructive, and process-control techniques

J. Baker-Jarvis, C. Jones, B. Riddle, M. Janezic, R. G. Geyer, J. H. Grosvenor, C. M. Weil

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Abstract

Abstract A review of the most common methods for nondestructive permittivity and permeability measurements is presented. Transmission-line techniques, coaxial apertures, open resonators, surface-waves, and dielectric resonator methods are examined. Measurements on bulk, thin materials, and thin films are addressed. Measurement fixtures that can be used as sensors are highlighted. The frequency range of applicability and typical uncertainties associated with each method are addressed.
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Research context

OpenAlex topics: Microwave and Dielectric Measurement Techniques · Acoustic Wave Resonator Technologies · Microwave Engineering and Waveguides

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References (100+)

Show source-provided references
1. I. Bahl and K. Ely,Microwave J. 33: 131–146 (1990)
2. C.S. Chang and A.P. Agrawal.44th Electronic Components and Technology Conference, IEEE Components, Hybrids, and Manufacturing Technology Society, pp. 564–569 (1994)
3. W.P. Westphal. Laboratory for Insulation Research Technical Report XXXVI, MIT, Cambridge, MA (1950)
4. J. Baker-Jarvis, M.D. Janezic, J.H. Grosvenor, and R. G. Geyer. Technical Note 1355, National Institute of Standards and Technology (1992)
5. A.R.V. Hippel,Dielectric Materials and Applications, MIT Press, Cambridge, MA (1954)
6. C.J.F. Bottcher and P. Bordewijk,Theory of Electric Polarization, Vols. I and II, Elsevier, New York (1978)
7. A.M. Nicolson and G.F. Ross,IEEE Trans. Instrum. Meas. IM-19:377–382 (1968)10.1109/TIM.1970.4313932 ↗
8. H.E. Bussey and J.E. Gray,IRE Trans. Inst. I-11(3): 162–165 (1962)10.1109/IRE-I.1962.5006623 ↗
9. W.B. Weir,Proc. IEEE 62: 33–36 (1974)10.1109/PROC.1974.9382 ↗
10. J. Baker-Jarvis. Technical Report TN 1341, National Institute of Standards and Technology (1990)
11. J. Baker-Jarvis, E. Vanzura, and W. Kissick,IEEE Trans. Microwave Theory Tech. 38: 1096–1103 (1990)10.1109/22.57336 ↗
12. E.J. Vanzura, J.R. Baker-Jarvis, J.H. Grosvenor, and M.D. Janezic,IEEE Trans. Microwave Theory Tech. 42:2063–2070 (1994)10.1109/22.330120 ↗
13. R.B. Goldfarb and H.E. Bussey,Rev. Sci. Instrum. 58(4):624–627 (1987)10.1063/1.1139227 ↗
14. J. Baker-Jarvis, R.G. Geyer, and P.D. Domich,IEEE Trans. Instrum. Meas. 41(5): 646–652 (1992)10.1109/19.177336 ↗
15. K.E. Mattar, D.G. Watters, and M.E. Brodwin,IEEE Trans. Microwave Theory Tech. 39(3): 532 (1991)10.1109/22.75297 ↗
16. R.A. York and R.C. York,Microwave J. 33: 115–121 (1990)
17. G.R. Traut,Microwave J. 24: 73–79 (1981)
18. J.Q. Howell,IEEE Trans. Microwave Theory Tech. MTT-21: 142–143 (1973)10.1109/TMTT.1973.1127950 ↗
19. L.S. Napoli,IEEE Trans. Microwave Theory Tech. MTT-19: 664–667 (1971)10.1109/TMTT.1971.1127601 ↗
20. K.C. Gupta, R. Garg, and I.J. Bahl,Microwave Lines and Slotlines, Artech House, Norwood, MA (1979)
21. M.V. Schneider,Bell Sys. Tech. J. (May–June): 1421–1444 (1968)
22. K.M. Fidanboylu, S.M. Riad, and A. Elshabini-Riad,IEEE Trans. Instrum. Meas. M-39: 940–944 (1990)10.1109/19.65802 ↗
23. R.A. Waldron.IEEE Trans. Microwave Theory Tech. (January): 123–131 (1964)10.1109/TMTT.1964.1125760 ↗
24. H.A. Wheeler,IEEE Trans. Microwave Theory Tech. MTT-13: 172–185 (1965)10.1109/TMTT.1965.1125962 ↗
25. W.J. Getsinger,IEEE Trans. Microwave Theory Tech. IM-21:34–39 (1973)10.1109/TMTT.1973.1127911 ↗
26. I.J. Bahl and S.S. Stuchly,IEEE Trans. Microwave Theory Tech. MTT-28: 104–109 (1980)10.1109/TMTT.1980.1130018 ↗
27. H. Tanaka and F. Okada,IEEE Trans. Instrum. Meas. IM-38: 509–514 (1989)10.1109/19.192336 ↗
28. J. Murray Olyphant and J.H. Ball,IEEE Trans. Elec. Insul. EI-5: 26–32 (1970)10.1109/TEI.1970.299090 ↗
29. N.K. Das, S.M. Voda, and D.M. Pozar,IEEE Trans. Microwave Theory Tech. MTT-35: 636–641 (1987)10.1109/TMTT.1987.1133722 ↗
30. M. Clapeau, P. Guillon, and Y. Garault,Proc. 7th European Microwave Conf., EuMC'77 pp. 545–549 (1977)
31. K. Laursen, D. Hertling, N. Berry, S. A. Bidstrup, P. Kohl, and G. Arroz.IEPS Proc., San Diego, CA, pp. 11–13 (1993)
32. C.S. Chang,IEEE Trans. Compon., Hybrids, Manuf. Technol. 16: 909–918 (1993)10.1109/33.273692 ↗
33. H. Levine and C.H. Papas,J. Appl. Phys. 22: 29–43 (1951)10.1063/1.1699816 ↗
34. J.R. Mosig, J.E. Besson, M.G. Fabry, and F.E. Gardiol,IEEE Trans. Instrum. Meas. 30(1): 46–51 (1981)10.1109/TIM.1981.6312437 ↗
35. M.A. Stuchly and S.S. StuchlyIEEE Trans. Instrum. Meas. IM-29: 176–183 (1980)10.1109/TIM.1980.4314902 ↗
36. D. Blackham.Microwave Power Symposium, International Microwave Power Institute, pp. 44–45 (1990)
37. L.L. Li, N.H. Ismail, L.S. Taylor, and C.C. Davis,IEEE Trans. Biomed. Eng. 39: 49–57 (1992)10.1109/10.108127 ↗
38. P.D. Langhe, K. Blomme, L. Martens, and D.D. Zutter,IEEE Trans. Instrum. Meas. IM-42: 879–886 (1993)10.1109/19.252521 ↗
39. J. Baker-Jarvis, M.D. Janezic, P.D. Domich, and R.G. Geyer,IEEE Trans. Instrum. Meas. (October): 711–718 (1994)10.1109/19.328897 ↗
40. T.E. Hodgetts. Memo. 4331, Royal Signals and Radar Establishment (1989)
41. S. Jenkins, T.E. Hodgetts, G.T. Symm, A.G.P. Warhamm, and R.N. Clarke,Elect. Lett. 24: 234–235 (1992)
42. S. Bringhurst and M.F. Iskander.Ceramics Trans., Amer. Ceram. Soc., pp. 503–510 (1993)
43. S. Ganchev, S. Bakhtiari, and R. Zoughi,IEEE Trans. Instrum. Meas. 41: 361–365 (1992)10.1109/19.153329 ↗
44. S. Ganchev, S. Bakhtiari, and R. Zoughi,IEEE Trans. Instrum. Meas. 44 (1995)
45. S. Bakhtiari, S. Ganchev, and R. Zoughi,IEEE Trans. Instrum. Meas. 42: 19–24 (1993)10.1109/19.206673 ↗
46. M. Bramanti and E. Salerno,J. Microwave Power 27(4): 209–216 (1992)
47. S.C. Olson and M.F. Iskander,IEEE Trans. Instrum. Meas. IM-35: 2–6 (1986)10.1109/TIM.1986.6499047 ↗
48. T. Sphicopoulos, V. Teodoridis, and F.E. Gardiol.J. Microwave Power 20: 165–172 (1985)10.1080/16070658.1985.11720300 ↗
49. J. Baker-Jarvis and R.G. Geyer. Presented at URSI, Boulder, CO,URSI Digest (1992)
50. R. Zoughi and M. Lujan.Mat. Eval. 48: 1100–1105 (1989)
51. F.E. Gardiol, T. Sphicopoulos, and V. Teodoridis,The Reflection of Open-Ended Circular Waveguides: Application to Nondestructive Measurement of Materials, Vol. 1, pp. 325–364 Plenum Press, New York (1983)
52. V. Teodoridis, T. Sphicopoulos, and F.E. Gardiol.IEEE Trans. Microwave Theory Tech. MTT-33: 359–366 (1985)10.1109/TMTT.1985.1133006 ↗
53. J. Baker-Jarvis and M.D. Janezic.IEEE Trans. (in press)
54. H.E. Bussey,IEEE Trans. Instrum. Meas. IM-29: 120–124 (1980)10.1109/TIM.1980.4314884 ↗
55. J. Baker-Jarvis, M.D. Janezic, and R. Stafford. Technical Note 5001. National Institute of Standards and Technology (1992)
56. S. Jenkins, T.E. Hodgetts, R.N. Clarke, and A.W. Preece.Meas. Sci. Technol. 1: 691–702 (1990)10.1088/0957-0233/1/8/005 ↗
57. M.D. Janezic and J. Baker-Jarvis. Full-Mode Solution for the Shielded Open-Circuited Holder for Liquids and Powders, in preparation (1995)
58. N. Belhadj-Tahar and A. Fourrier-Lamer.IEEE Trans. Microwave Theory Tech. 34: 346–349 (1986)10.1109/TMTT.1986.1133342 ↗
59. N. Belhadj-Tahar, A. Fourrier-Lamer, and H. de Chanterac.IEEE Trans. Microwave Theory Tech. 38: 1–7 (1990)10.1109/22.44149 ↗
60. T. Wells.AMTA Workshop Proc., Chicago, IL, pp. 50–62 (1992)
61. D.K. Ghodgaonkar, V.V. Varidan, and V.K. Varadan.IEEE Trans. Instrum. Meas. 37: 789–793 (1989)10.1109/19.32194 ↗
62. J. Muscil and F. Zacek.Microwave Measurements of Complex Permittivity by Free-Space Methods and Their Applications, Elsevier, New York (1986)
63. D.K. Ghodgaonkar, O.P. Gandhi, and M.J. Hagmann,IEEE Trans. Microwave Theory Tech. MTT-31(6): 442–446 (1983)10.1109/TMTT.1983.1131523 ↗
64. J.C. Bolomey and C. Pichot,Int. J. Imag. Syst. Tech. 1: 119–131 (1990)
65. A.C. Lynch.IEEE Trans. Instrum. Meas. 23: 425–430 (1974)10.1109/TIM.1974.4314327 ↗
66. M.A. Afsar.IEEE Trans. Microwave Theory Tech. MTT-32: 1598–1609 (1984)10.1109/TMTT.1984.1132899 ↗
67. H. Kogelnik and T. Li,Proc. IEEE 54: 1312–1328 (1966)10.1109/PROC.1966.5119 ↗
68. R.G. Jones.IEEE Proc. 123: 285–290 (1976)
69. R.N. Clarke and C.B. Rosenberg,J. Phys. E.: Sci. Instrum. 15(9): 9–24 (1982)10.1088/0022-3735/15/1/002 ↗
70. J. Zhao, K.D. Stephan, S. Wong, and R.S. Porter.J. Infrared Millimeter Waves 9 (12): 1093–1105 (1988)10.1007/BF01009303 ↗
71. G. Arjavalingam, Y. Pastol, J. Halbout, and G.V. Kopcsay,IEEE Trans. Microwave Theory Tech. 38: 615–621 (1990)10.1109/22.54930 ↗
72. H.E. Bussey.Proc. IEEE 55: 1046–1053 (1967)10.1109/PROC.1967.5719 ↗
73. L. Hartshorn and W.H. Ward.J. Inst. Elec. Eng. 79: 597–609 (1936)
74. M.G. Broadhurst and A.J. Bur,J. Res. Bur. Stands. Tech. 69C(3): 165–172 (1965)
75. W.P. Westphal, Lab. for Insulation Research Technical Report 201, MIT, Cambridge, MA (1966)
76. W.P. Westphal and J. Iglesias. Dielectric Spectroscopy of High-Temperature Materials, Air Force Materials Lab, AFML-TR-71-66, Wright-Patterson AFB (1971)
77. H.S. Endicott and E.J. McGowan. Measurement of Dielectric Constant and Dissipation Factor Without Electrodes. Technical Information Series 60GL214, General Electric (1960)
78. W.P. Harris and A.H. Scott. Precise Measurement of Dielectric Constant by the Two-Fluid Technique,Conf. on Electrical Insulation (1962)10.1109/EIC.1962.7466673 ↗
79. F.I. Mopsik. Technical Report TN 1294, National Institute of Standards and Technology (1992)
80. New Technologies for Wide Impedance Range Measurements to 1.8 GHz, Product Note No. 4291-1, Hewlett-Packard (1994)
81. R.D. Harrington, R.C. Powell, and P.H. Haas,J. Res. Nat. Bur. Stds. 56(3): 129–133 (1956)10.6028/jres.056.017 ↗
82. C.N. Works, T.W. Dakin, and F.W. Boggs,AIEE Trans. 63: 1092–1098 (1944)
83. W. Xi, W.R. Tinga, W.A.G. Voss, and B.Q. Tian,IEEE Trans. Microwave Theory Tech. 40: 747–753 (1992)10.1109/22.127525 ↗
84. A. Kaczkowski and A. Milewski,IEEE Trans. Microwave Theory Tech. MTT-28(3): 225–228 (1980)10.1109/TMTT.1980.1130045 ↗
85. A. Kaczkowski and A. Milewski,IEEE Trans. Microwave Theory Tech. MTT-28(3): 228–231 (1980)10.1109/TMTT.1980.1130046 ↗
86. J. Baker-Jarvis and B. Riddle.IEEE Trans. Microwave Theory Tech. (in preparation)
87. G. Kent,IEEE Trans. Microwave Theory Tech. MTT-31: 1452–1454 (1990)
88. G. Kent.Proc. 3rd Int. Symp. on Recent Advances in Microwave Technology, pp. 1–4 ISRAMT'91 (1991)
89. G. Kent,Microwave J. (December): 72–82 (1991)
90. B.W. Hakki and P.D. Coleman,IEEE Trans. Microwave Theory Tech. MTT-8: 402–410 (1960)10.1109/TMTT.1960.1124749 ↗
91. W.E. Courtney,IEEE Trans. Microwave Theory Tech. MTT-18: 467–485 (1970)
92. Y. Kobayashi.IEEE Trans. Microwave Theory Tech. MTT-28: 1077–1085 (1980)10.1109/TMTT.1980.1130228 ↗
93. J. Krupka,IEEE Trans. Microwave Theory Tech. MTT-33: 274–277 (1985)10.1109/TMTT.1985.1132999 ↗
94. Y. Kobayashi,IEEE Trans. Microwave Theory Tech. MTT-41: 2198–2204 (1993)10.1109/22.260706 ↗
95. J. Krupka, F. Derzwcowski, and J. Modelski, Presented at MIKON, Poland,MIKON Digest, 393–397 (1991)
96. Y. Kobayashi and M. Katoh,IEEE Trans. Microwave Theory Tech. MTT-33: 586–592 (1985)10.1109/TMTT.1985.1133033 ↗
97. T. Nishikawa, H. Tanaka, and Y. Ishikawa,IECE of Japan Symp. Digest, 154–155 (1986)
98. S. Maj and M. Pospieszalski,MTT-S Digest (May): 190–192, IEEE (1984)10.1109/MWSYM.1984.1131734 ↗
99. G.I. Woolaver,Microwave & RF 24: 153–158 (1990)
100. J. Delaballe,Electron. Telecommun. 35: 80–83 (1981)