Electrical control of the exchange bias effect at model ferromagnet-altermagnet junctions

This work analyzes the behavior of the interface between a ferromagnetic material and an altermagnet. We use a well-established line of arguments based on electronic mean-field calculations to show that new surface phenomena that lead to altermagnetic materials induce an exchange bias effect on the nearby ferromagnet. We reveal the physical mechanisms behind this phenomenon that lead to quantitative control over its strength. Interestingly, we predict exotic electric-field-induced phenomena. This is an analogy to the relationship between exchange bias and the injection of spin currents in spin-transfer-dominated scenarios, which has been reported earlier in the traditional antiferromagnetic/ferromagnetic junction.