Inverse Stranski–Krastanov Growth in Single-Crystalline Sputtered Cu Thin Films for Wafer-Scale Device Applications
Abstract
Research context
OpenAlex topics: Copper Interconnects and Reliability · ZnO doping and properties · Semiconductor materials and devices
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Affiliations
Center for Nanophysics and Advanced Materials, and Department of Materials Science and Engineering, University of Maryland, College Park, Maryland 20742, United States
Department of Cogno-Mechatronics Engineering, Pusan National University, Busan 46241, Republic of Korea
Crystal Bank Research Institute, Pusan National University, Miryang 50463, Republic of Korea
Analytical Engineering Group, Samsung Advanced Institute of Technology (SAIT), Samsung Electronics Co., Suwon 16678, Republic of Korea
Pohang Accelerator Laboratory, Pohang University of Science and Technology, Pohang 37673, Republic of Korea
Department of Nanoenergy Engineering, Pusan National University, Busan 46241, Republic of Korea
Department of Optics and Mechatronics Engineering, Pusan National University, Busan 46241, Republic of Korea
Center for Integrated Nanostructure Physics, Institute for Basic Science, Sungkyunkwan University, Suwon 16419, Republic of Korea
Funding
National Research Foundation of Korea · Institute for Basic Science