journal article·2024-12-31Open access

A generalised FK model for the 558 line defect in graphene

Yin Yao, Jingjing Yang, Yafeng He, Jianhui Bai

Philosophical Magazine Letters· Volume 104· Issue 1

Abstract

Defects in two-dimensional nanomaterials do not always affect their properties negatively, but often have useful functionality. The 558 line defect in graphene distinctively acts as a quasi-one-dimensional metallic wire and a valley filter, which is already experimentally realised. To have a thorough understanding of the 558 line defect in graphene, we have extended the conventional FK model and have applied the model to theoretically investigate the structure of the 558 line defect, which agrees well with the first-principle simulation result. In the generalised FK model, it is vital to take into account bond energy correction to the interatomic force of atoms on the defect line. The generalised FK model can be used to predict structures of one-dimensional topological defects in other two-dimensional materials.
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Research context

OpenAlex topics: Graphene research and applications · Surface and Thin Film Phenomena · Thermal properties of materials

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

School of Sciences, Changzhou Institute of Technology, Changzhou, People's Republic of China

Jiangsu Key Laboratory of Non-traditional Machining, Changzhou, People's Republic of China

School of Aviation and Mechanical Engineering, Changzhou Institute of Technology, Changzhou, People's Republic of China

Funding

National Natural Science Foundation of China · Natural Science Foundation of JiangSu Province · Changzhou Sci&Tech Program

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