journal article·2014-04-03

Cu3Sn suppression criterion for solid copper/molten tin reaction

F. Hodaj, O. Liashenko, A.M. Gusak

Philosophical Magazine Letters· Volume 94· Issue 4
Publisher page

Abstract

AbstractThe formation of Cu3Sn phase in the soldering reaction is believed to be harmful for the reliability of solder contacts on account of Kirkendall voiding in the compound. In this study, a criterion for the suppression of the growth of this phase by the fast growing scallop-like Cu6Sn5 compound is presented. The average thickness of the η-Cu6Sn5 phase above which the ε-Cu3Sn phase starts to grow as a continuous layer at the Cu/Cu6Sn5 interface during liquid Sn/solid Cu interaction has been evaluated from thermodynamic and kinetic considerations.Keywords: solid phase reactionsdiffusionthermodynamicsinterfacessolderingphase competition AcknowledgementOne of the authors (AMG) is grateful to the Ministry of Education and Science and the State Fund for Fundamental researches (Ukraine) for partial support.
Source: openalex_inverted_index · Quality: baseline

Research context

OpenAlex topics: Electronic Packaging and Soldering Technologies · 3D IC and TSV technologies · Metallurgical and Alloy Processes

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

References (27)

Show source-provided references
1. 10.1016/S0927-796X(02)00007-410.1016/S0927-796X(02)00007-4 ↗
2. 10.1016/j.mser.2005.03.00110.1016/j.mser.2005.03.001 ↗
3. 10.1007/s11664-011-1836-110.1007/s11664-011-1836-1 ↗
4. 10.1007/BF0265137110.1007/BF02651371 ↗
5. 10.1016/S0921-5107(98)00202-510.1016/S0921-5107(98)00202-5 ↗
6. Song F.B. · Proc. 56th Electronic Components and Technology Conference · 2006 · 119610.1109/ECTC.2006.1645804 ↗
7. Yang C. · Proc. 61th Electronic Components and Technology Conference · 2011 · 970
8. 10.1063/1.183963710.1063/1.1839637 ↗
9. Mei Z. · Proc. 55th Electronic Components & Technology Conference · 2005 · 415
10. Xu L. · Proc. 56th Electronic Components & Technology Conference · 2006 · 275
11. Handwerker C.A. · 2006
12. Borgesen P. · Proc. 57th Electronic Components & Technology Conference · 2007 · 136
13. Weinberg K. · International Conf. on Electronic Packag. Techn. & High Density Packag., IEEE · 2009 · 32 · 684
14. 10.1016/j.microrel.2008.09.01010.1016/j.microrel.2008.09.010 ↗
15. 10.1007/s11661-010-0592-910.1007/s11661-010-0592-9 ↗
16. 10.1007/s11669-011-9907-910.1007/s11669-011-9907-9 ↗
17. 10.1007/s11664-999-0158-z10.1007/s11664-999-0158-z ↗
18. 10.1007/s11664-003-0113-310.1007/s11664-003-0113-3 ↗
19. 10.1108/0954091131129456010.1108/09540911311294560 ↗
20. 10.1103/PhysRevB.53.1602710.1103/PhysRevB.53.16027 ↗
21. 10.1016/j.actamat.2007.11.00910.1016/j.actamat.2007.11.009 ↗
22. 10.1103/PhysRevB.66.11540310.1103/PhysRevB.66.115403 ↗
23. 10.1016/0364-5916(91)90030-N10.1016/0364-5916(91)90030-N ↗
24. Shim J.H. · Z. Metallkd. · 1996 · 87 · 205
25. 10.1016/j.actamat.2007.11.00910.1016/j.actamat.2007.11.009 ↗
26. 10.1088/0953-8984/13/12/30210.1088/0953-8984/13/12/302 ↗
27. 10.1080/09500839.2011.60025710.1080/09500839.2011.600257 ↗