Nanoscopic Characterization and Mechanism Analysis of LiTaO3/Si Interfaces Prepared by Mo/Au Nanoadhesive Layers for Applications in LiTaO3-Based Devices
Abstract
Research context
OpenAlex topics: Semiconductor materials and devices · Ferroelectric and Piezoelectric Materials · Ferroelectric and Negative Capacitance Devices
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Affiliations
School of Information Engineering, Xianyang Polytechnic Institute, Xi’an 712000, China
Xi’an Key Laboratory of Advanced Control and Intelligent Process, Xi’an University of Posts and Telecommunications, Xi’an 710121, China
State Key Laboratory for Artifcial Microstructure and Mesoscopic Physics, School of Physics, Peking University, Beijing 100871, China
Key Laboratory for Physical Electronics and Devices, Ministry of Education, School of Electronics and Information Engineering, Xi’an Jiaotong University, Xi’an 710049, China
Institute of Wide Band Gap Semiconductors, School of Electronics and Information Engineering, Xi’an Jiaotong University, Xi’an 710049, China
Funding
National Key Research and Development Program of China · China Postdoctoral Science Foundation · Natural Science Basic Research Program of Shaanxi Province · Education Department of Shaanxi Province · National Natural Science Foundation of China · Xianyang City · Xianyang Polytechnic Institute