Anisotropic Properties of Tellurium Nanoflakes Probed by Polarized Raman and Transient Absorption Microscopy: Implications for Polarization-Sensitive Applications
Abstract
Research context
OpenAlex topics: Chalcogenide Semiconductor Thin Films · 2D Materials and Applications · Quantum Dots Synthesis And Properties
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Affiliations
College of Mathematics and Physics, Beijing University of Chemical Technology, Beijing 100029, China
GBA branch of Aerospace Information Research Institute, Chinese Academy of Sciences, Guangzhou 510700, China
Key Laboratory of Luminescence and Optical Information, Ministry of Education, Institute of Optoelectronic Technology, Beijing Jiaotong University, Beijing 100044, China
CAS Center for Excellence in Nanoscience, National Center for Nanoscience and Technology, University of Chinese Academy of Sciences, Beijing 100190, China
Key Laboratory of Artificial Micro- and Nano-structures of Ministry of Education and School of Physics and Technology, Wuhan University, Wuhan 430072, China
School of Physical Science and Technology, Inner Mongolia University, Hohhot 010021, Inner Mongolia, People’s Republic of China
Funding
Natural Science Foundation of Beijing Municipality · Central University Basic Research Fund of China · National Natural Science Foundation of China