Characterization of aluminium nitride thin film structure using second-harmonic generation
Bibliographic record
Abstract
No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.
Source: Not provided · Quality: missing
Research context
OpenAlex topics: Nonlinear Optical Materials Research · Spectroscopy and Quantum Chemical Studies · Photorefractive and Nonlinear Optics
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (11)
Show source-provided references
1. Pauleau · Bulletin de la societe chimique de France · 1979 · 5–6 · 199
2. Levine · Phys. Rev. Lett. · 1970 · 25 · 44010.1103/PhysRevLett.25.440 ↗
3. Fujii · Appl. Phys. Lett. · 1977 · 33 · 81510.1063/1.89550 ↗
4. Yoshida · J. Vac. Sci. Technol. · 1979 · 16 · 99010.1116/1.570166 ↗
5. Canto-Said · Mol. Cryst. Liq. Cryst. Sci. Technol.-Sec B: Nonlinear Optics · 1992 · 3 · 341
6. Cachard · Vacuum · 1990 · 41 · 115110.1016/0042-207X(90)93895-P ↗
7. Ulrich · Appl. Optics · 1973 · 12 · 290110.1364/AO.12.002901 ↗
8. Jerphagnon · J. Appl. Phys. · 1970 · 41 · 166710.1063/1.1659090 ↗
9. Kleinman · Phys. Rev. · 1962 · 126 · 197710.1103/PhysRev.126.1977 ↗
10. Dmitriev · 1991 · Vol. 64
11. Gräupner · J. Appl. Phys. · 1992 · 71 · 413610.1063/1.350844 ↗