Film thickness measurement and linear dichroism of organic thin films prepared by molecular beam deposition at oblique incidence
Bibliographic record
Abstract
No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.
Source: Not provided · Quality: missing
Research context
OpenAlex topics: Molecular Junctions and Nanostructures · Spectroscopy and Quantum Chemical Studies · Photochemistry and Electron Transfer Studies
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (7)
Show source-provided references
1. Ch. Bosshard, K. Sutter, Ph. Prêtre, J. Hulliger, M. Flörsheimer, P. Kaatz, P. Günter, Organic Nonlinear Optical Materials, Gordon and Breach Basel, 1995, in: F. Kajzar, J.D. Swalen (Eds.), Organic Thin Films for Waveguiding in Nonlinear Optics, Gordon and Breach, Amsterdam, 1996
2. Y. Park, E.E. Fullerton, S.D. Bader, Appl. Phys. Lett. 66 (1995) 2140; L. Jorritsma, Growth Anisotropies in Cu(0 0 1) Homoepitaxy, Wormgoor B.V. Almelo Netherlands, 1997; Y. Takeda, T. Motohiro, T Hioki, S. Noda, J. Vac. Sci. Technol. B 16 (1998) 7
3. C. Cai, M. Bösch, Y. Tao, B. Müller, Z. Gan, A. Kündig, C. Bosshard, I. Liakatas, M. Jäger, P. Günter, J. Am. Chem. Soc. 120 (1998) 856310.1021/ja981551g ↗
4. R. Schlesser, Diss. No. 11456 ETH Zürich, 1996
5. H.G. Tompkins, A User's Guide to Ellipsometry, Academic Press, Boston, 1993
6. C. Cai, Y. Tao, B. Müller, unpublished
7. A. Rodger, B. Nordén, Circular Dichroism and Linear Dichroism, Oxford University Press, Oxford, New York, Tokyo, 199710.1093/oso/9780198558972.001.0001 ↗