Waveguiding properties of pulsed-laser deposition Ca4GdO(BO3)3 thin films

Abstract Waveguiding properties of stoichiometric Ca4GdO(BO3)3 (GdCOB) thin films deposited on quartz substrates by the pulsed-laser deposition (PLD) technique are reported. The optical properties and the anisotropy of the obtained thin films are investigated using the prism-coupling technique. Refractive indices (nx=1.666, ny=1.673 and nz=1.680 at 632.8 nm) were, respectively, determined from the transverse electric (TE) and the transverse magnetic (TM) mode excitations. These values are found to be 3% lower than those of the bulk material, which is likely due to the structural and morphological features of the deposited GdCOB films.