journal article·1995-01

Characterization and identification of the deep levels in V doped CdTe and their relationship with the photorefractive properties

G. Bremond, A. Zerrai, G. Marrakchi, A. Aoudia, Y. Marfaing, R. Triboulet, M.C. Busch, J.M. Koebbel, M. Hage-Ali, P. Siffert, J.Y. Moisan

Optical Materials· Volume 4· Issue 2-3
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Abstract

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Research context

OpenAlex topics: Photorefractive and Nonlinear Optics · Integrated Circuits and Semiconductor Failure Analysis · Photonic and Optical Devices

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References (10)

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6. Kalboussi · Annales Maghrébines de l'Ingénieur · 1993 · Vol 7 · 1327
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9. Moisan · 1995 · 4 · 219
10. Emanuelson · Phys. Rev. B · 1993 · 47 · 1557810.1103/PhysRevB.47.15578 ↗