Characterization and identification of the deep levels in V doped CdTe and their relationship with the photorefractive properties
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OpenAlex topics: Photorefractive and Nonlinear Optics · Integrated Circuits and Semiconductor Failure Analysis · Photonic and Optical Devices
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References (10)
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1. Partovi · Appl. Phys. Lett. · 1990 · 57 · 84610.1063/1.103409 ↗
2. Ziari · J. Opt. Soc. Am. B · 1992 · 9 · 146110.1364/JOSAB.9.001461 ↗
3. J.Y. Moisan, N. Wolffer, O. Moine, P. Gravey, G. Martel, K. Aoudia, E. Rzepka, Y. Marfaing and R. Triboulet, J. Opt. Soc. Am. B to be published.
4. Zielinger · Materials Science Engineering B · 1993 · 16 · 27310.1016/0921-5107(93)90059-V ↗
5. Launay · Appl. Phys. · 1992 · A55 · 3310.1007/BF00324599 ↗
6. Kalboussi · Annales Maghrébines de l'Ingénieur · 1993 · Vol 7 · 1327
7. Bremond · Revue Phys. Appl. · 1987 · 22 · 87310.1051/rphysap:01987002208087300 ↗
8. Rzepka · J. Cryst. Growth · 1994 · 138 · 24410.1016/0022-0248(94)90815-X ↗
9. Moisan · 1995 · 4 · 219
10. Emanuelson · Phys. Rev. B · 1993 · 47 · 1557810.1103/PhysRevB.47.15578 ↗