journal article·2013-10

Effect of compressive stress on doping efficiency of nitrogen in ZnO films

Wei-Wei Liu, Zhen-Zhong Zhang, Bin Yao, De-Zhen Shen, Cheng-Lin Liu

Optical Materials· Volume 35· Issue 12
Publisher page

Abstract

Nitrogen (N)-doped ZnO films (ZnO:N) grown on the a-/c-plane sapphire substrates (a-/c-Al2O3) by plasma-assisted molecular beam epitaxy were investigated. It was found that the content of N in the ZnO films grown on c-Al2O3 is higher than that of the films grown on a-Al2O3. The ZnO:N films grown on c-Al2O3 have lower carrier concentration and larger intensity ratio of the DAP/D degrees X emission compared with those of the ZnO:N films grown on a-Al2O3 under the same growth conditions, which indicates higher incorporation efficiency of N in the ZnO films grown on c-Al2O3. (C) 2013 Elsevier B.V. All rights reserved.
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Research context

OpenAlex topics: ZnO doping and properties · Ga2O3 and related materials · Copper-based nanomaterials and applications

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