Optical studies of SnTexSe1−x sintered films
Source abstract
Abstract
Abstract Large scale applications are based on the economical polycrystalline material prepared by convenient, reproducible and commercially viable methods. Polycrystalline sintered films of SnTe x Se 1− x were deposited on glass substrate by screen printing technique. The optical and structural studies of the films were carried out by UV–Vis–NIR spectrophotometer and X-ray diffraction, respectively. The films were polycrystalline in nature with the average grain size 27.77 nm. The solid solution shows a change from orthorhombic to cubic in structure. The energy band gap of the films was determined using absorption spectra. It was found to vary with composition from 1.02 to 0.35 eV.
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Research context
OpenAlex topics: Chalcogenide Semiconductor Thin Films · Phase-change materials and chalcogenides · Quantum Dots Synthesis And Properties
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (22)
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