Characterization of Y2SiO5:Ce thin films

Abstract Uncoated and SnO2-coated Y2SiO5:Ce thin film phosphors grown on Si (1 0 0) substrates by a pulsed laser deposition technique were characterized with scanning electron microscopy (SEM), atomic force microscopy (AFM), energy dispersive X-Ray analysis (EDS) and X-Ray diffraction (XRD). Cathodoluminescence (CL) of both the uncoated and SnO2-coated thin film phosphors was investigated for possible application in low voltage field emission displays (FEDs). Blue emission with peak values at 440 and 500 nm was from spherically shaped particles distributed unevenly on the surfaces of both the uncoated and coated thin film phosphors.