Microstructures and their influence on the optical band gaps of polycrystalline Bismuth thin films in the quantum confinement regime
Bibliographic record
Abstract
No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.
Source: Not provided · Quality: missing
Research context
OpenAlex topics: Advanced Semiconductor Detectors and Materials · Advanced Thermoelectric Materials and Devices · Topological Materials and Phenomena
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (44)
Show source-provided references
1. Localized edge states in two-dimensional topological insulators: ultrathin Bi films10.1103/PhysRevB.83.121310 ↗
2. One-dimensional topological edge states of bismuth bilayers10.1038/nphys3048 ↗
3. Bismuthene on a SiC substrate10.1126/science.aai8142 ↗
4. Stable nontrivial Z2 topology in ultrathin Bi (111) films: a first-principles study10.1103/PhysRevLett.107.136805 ↗
5. Epitaxial growth of free-standing bismuth film on graphene embedded with nontrivial properties10.1021/acsaelm.9b00366 ↗
6. Atomic and electronic structure of bismuth-bilayer-terminated Bi2Se3 (0001) prepared by atomic hydrogen etching10.1103/PhysRevB.91.205430 ↗
7. Visualizing topological edge states of single and double bilayer Bi supported on multibilayer Bi(111) films10.1103/PhysRevB.98.245108 ↗
8. Topologically nontrivial bismuth(111) thin films
9. Semimetal-to-semiconductor transition in bismuth thin films10.1103/PhysRevB.48.11431 ↗
10. Comment on “Semimetal-to-semiconductor transition in bismuth thin films,”
11. Quantum-size effects in n-type bismuth thin films10.1063/1.1567044 ↗
12. Role of the surface states in the magnetotransport properties of ultrathin bismuth films10.1103/PhysRevB.82.125326 ↗
13. Observation of the quantum and classical size effects in polycrystalline thin bismuth films
14. The crystalline structure of thin bismuth layers grown on Silicon (111) substrates10.3390/ma15144847 ↗
15. Structural properties of Bi thin film grown on Si (111) by quasi-van der Waals epitaxy10.1038/s41598-022-06472-5 ↗
16. Direct bandgap dependence of bismuth films on their thickness10.1063/5.0095477 ↗
17. Structural and magnetotransport properties of Bi thin films grown by thermal evaporation10.1016/j.jmmm.2009.03.052 ↗
18. Physical characteristics of thermally evaporated Bismuth thin films10.1016/j.vacuum.2005.10.010 ↗
19. Investigation of growth characteristics and semimetal-semiconductor transition of polycrystalline bis muth thin films10.1107/S2052252519015458 ↗
20. Optical properties of bismuth nanostructures towards the ultrathin film regime10.1364/OME.9.002924 ↗
21. Laser oxidation and wide-band photoluminescence of thermal evaporated bismuth thin films10.1088/0022-3727/41/2/025405 ↗
22. Illumination source identification using a CMOS optical microsystem10.1109/TIM.2003.822476 ↗
23. Cullity · 1956
24. Effect of fluorine doping on the structural, optical, and electrical properties of spray deposited Sb2O3 thin films10.1016/j.mssp.2023.107405 ↗
25. An extensive comparative study for microstructural properties and crystal imperfections of Novel sprayed Cu3SbSe3 Nanoparticle-thin films of different thicknesses10.1016/j.ijleo.2020.165837 ↗
26. Intensive comparative study using X-Ray diffraction for investigating microstructural parameters and crystal defects of the novel nanostructural ZnGa2S4 thin films10.1016/j.spmi.2020.106544 ↗
27. Als‐Nielsen · 2011
28. X-Ray reflectivity characterisation of thin-film and multilayer structures
29. Birkholz · 2005
30. Holy · 1999
31. Thin film and surface characterization by specular X-ray reflectivity10.1080/10408439708241258 ↗
32. X-ray standing waves in a multi-trilayer system with linearly varying period10.1016/j.apsusc.2011.03.127 ↗
33. V Satyam
34. Surface studies of solids by total reflection of X-rays10.1103/PhysRev.95.359 ↗
35. Recent advances in characterization of ultra-thin films using specular X-ray reflectivity technique10.1016/j.tsf.2003.10.042 ↗
36. Ion-beam-induced mixing in a Si/Co/Si system involving ultrathin layers: a grazing-incidence X-ray standing-wave study
37. Epitaxial growth of ultrathin films of bismuth: an atomic force microscopy study10.1016/0169-4332(92)90135-K ↗
38. How to correctly determine the band gap energy of modified semiconductor photocatalysts based on UV-vis spectra10.1021/acs.jpclett.8b02892 ↗
39. Optical properties and electronic structure of Ge optical properties and electronic structure of amorphous germanium10.1002/pssb.19660150224 ↗
40. Optical and dispersion studies of thin S35-xGe15SnxTe50 films: assessment of some physical parameters of samples10.1088/1402-4896/acc2f9 ↗
41. Intensive linear and nonlinear optical studies of thermally evaporated amorphous thin Cu-Ge-Se-Te films10.1016/j.jnoncrysol.2022.121563 ↗
42. Optical characterization and dispersion discussions of the novel thermally evaporated thin a-S50-xGe10CdxTe40 films10.1007/s00339-022-06127-2 ↗
43. Tauc-plot scale and extrapolation effect on bandgap estimation from UV–vis–NIR data – a case study of β-Ga2O310.1016/j.jssc.2020.121576 ↗
44. Zallen · 1998