Spectrally resolved thermoluminescence and the surface fitting analysis. An application to LiF:Mg,Cu,P

Abstract Typical analysis of thermoluminescence (TL) data is based on various curve fitting algorithms. This approach is generally not suitable for advanced TL measurements utilizing simultaneous detection of wavelength and intensity of the emitted light. This paper presents a new ‘surface fitting’ algorithm making use of all measured points on the spectrally resolved TL surface. This technique allows simultaneous determination of activation energies and the emission bands of the material under study. Using the algorithm for unrestricted peak positions it is possible e.g. to distinguish between bulk and localized transitions. This approach is applied to high-sensitive LiF:Mg,Cu,P TL detector.