journal article·2003-12

Diffusion mechanism and photoluminescence of erbium in GaN

Yi-Sheng Ting, Chii-Chang Chen, Chien-Chieh Lee, Gou-Chung Chi, Tapas Kumar Chini, Purushottam Chakraborty, Hui-Wen Chuang, Jian-Shihn Tsang, Cheng-Ta Kuo, Wen-Chung Tsai, Shu-Han Chen, Jen-Inn Chyi

Optical Materials· Volume 24· Issue 3
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Abstract

Abstract Erbium has been diffused into GaN for the first time. A weak spontaneous emission is observed in the photoluminescence spectra after the diffusion process during 168 h at 800 °C under N2 atmosphere. The diffusion coefficient of erbium in GaN is obtained in Arrenhius expression to be D=1.8±1.3×10 −12 exp (−1±0.4 eV /kT) cm2/s. The result shows that the Er diffusion mechanism might be an interstitial-assisted process. The luminescence characteristics of the Er-diffused GaN is compared with the Er-implanted GaN. The methods to enhance the emission intensity of the Er-diffused GaN are discussed.
Source: openaire · Quality: candidate unverified · Source record ↗

Research context

OpenAlex topics: GaN-based semiconductor devices and materials · Ion-surface interactions and analysis · Silicon Nanostructures and Photoluminescence

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