journal article·2016-08

Characterization of X-ray polycapillary optics by LiF crystal radiation detectors through confocal fluorescence microscopy

Francesca Bonfigli, Dariush Hampai, Sultan B. Dabagov, Rosa Maria Montereali

Optical Materials· Volume 58
Publisher page

Abstract

Abstract Solid-state radiation imaging detectors based on photoluminescent colour centres in lithium fluoride (LiF) crystals have been successfully tested for both advanced 2D and 3D characterizations of X-ray polycapillary optics by a table-top laboratory system. Polycapillary optics can control X-ray beams propagation and allows obtaining quasi-parallel beam (half-lens) or focused beams (full-lens). The combination of a fine-focused micro X-ray tube and a polycapillary lens can provide the high intensity radiation fluxes that are necessary for high resolution X-ray imaging. In this paper we present novel results about advanced characterization of these complex optics by 2D as well as 3D confocal laser fluorescence microscopy of X-ray irradiated LiF crystal detectors. Two dimensional high spatial resolution images on a wide field of view of transmitted X-rays through a semi-lens and 3D direct inspection of the coloured volumes produced in LiF crystals by both focused and parallel X-ray beam transmitted by a full and a semi-lens, respectively, as well as their 3D reconstructions were obtained. The results show that the photoluminescent colour centres volume in LiF crystals combined with an optical sectioning reading system provide information about tomography of transmitted X-ray beams by policapillary optics in a single exposure process. For the first time, the use of LiF crystal plates as versatile radiation imaging luminescent detectors have been used to characterize the operation of polycapillary optics as X-ray lens, in focusing and parallel mode.
Source: openaire · Quality: candidate unverified · Source record ↗

Research context

OpenAlex topics: Advanced X-ray Imaging Techniques · X-ray Spectroscopy and Fluorescence Analysis · Crystallography and Radiation Phenomena

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

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