Refractive index modification from colour centres in dielectric confining structures
Source abstract
Abstract
Abstract Starting from a near-normal incidence transmittance measurement, a simple dipole–field interaction model has been applied to quantitatively evaluate the single contributions of different kinds of electronic defects to the overall refractive index change of the coloured volume of a low-energy electron irradiated LiF crystal.
Source: openaire · Quality: candidate unverified · Source record ↗
Research context
OpenAlex topics: Optical Coatings and Gratings · Thin-Film Transistor Technologies · Semiconductor materials and interfaces
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References (10)
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