journal article·2025-01

Influence of high-k La2O3 interfacial oxide layer on the performance of GaN based Schottky barrier ultraviolet-B and A photodetection sensors

Nallabala Nanda Kumar Reddy, K Vamsidhar Reddy, S. Kaleemulla, Shivani Sharma, V. Manjunath, Suresh Kumar, G. Gopi Krishana, P. Rosaiah, N. Ravi, Venkata Krishnaiah Kummara, Sunil Singh Kushvaha, Vasudeva Reddy Minnam Reddy, Yusuf Siraj Usmani

Optical Materials· Volume 158
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OpenAlex topics: GaN-based semiconductor devices and materials · Ga2O3 and related materials · Semiconductor materials and devices

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