journal article·2024-10

Hard X-ray nanoprobe to study the emission properties of Ce-doped YAG wafer by using XEOL and TR-XEOL

Yi-Chen Li, Tzu-Chi Huang, Yu-Hao Wu, Wei-Lon Wei, Tai-Sing Wu, Lo-Yeuh Chang, Chien-Yu Lee, Bo-Yi Chen, Gung-Chian Yin, Mau-Tsu Tang, Bi-Hsuan Lin

Optical Materials· Volume 156
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OpenAlex topics: Advanced Semiconductor Detectors and Materials · Luminescence Properties of Advanced Materials · ZnO doping and properties

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