EPR detection of Cr4+ centers in yttrium orthosilicate Y2SiO5
Source abstract
Abstract
The EPR spectra of Czochralski grown Y 2 SiO 5 :Cr and Y 2 SiO 5 : 53 Cr crystals have been studied. In addition to the previously known spectra of Cr 3+ , the spectrum of the Cr 4+ ion was detected and studied for the first time. The fine structure parameters of tetravalent chromium in Y 2 SiO 5 host were obtained based on the analysis of the angular and frequency-field dependences of the EPR spectra . The conclusion about tetrahedral coordination of Cr 4+ ion in this host was made. The concentrations ratio of c(Cr 3+ )/c(Cr 4+ ) ions in the crystal has been evaluated.
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Research context
OpenAlex topics: Luminescence Properties of Advanced Materials · Glass properties and applications · Solid-state spectroscopy and crystallography
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