SrAl2O4:Eu2+ (1%) luminescence under UV, VUV and electron beam excitation

This paper reports the luminescence properties of nanosized SrAl2O4:Eu2+ (1%) phosphors. The samples were prepared by combustion method at 600 °C, followed by annealing of the resultant combustion ash at 1000 °C in a reductive (Ar + H2) atmosphere. X-ray diffraction (XRD), photo luminescence (PL) and cathodoluminescence (CL) analysis and thermal stimulated luminescence (TSL) method were applied to characterize the phosphor. For the first time a peak at 375 nm was observed in CL spectra of SrAl2O4:Eu2+ (1%) nanophosphors. Luminescence excitation spectra analysis have shown that this peak is related to crystal defects. Also in TSL curve one strong peak was observed in the region above room temperature (T = 325 K), which is attributed to lattice defects, namely oxygen vacancies. A green LED was fabricated by the combination of the SrAl2O4:Eu2+ (1%) nanosized phosphor and a 365 nm UV InGaN chip.