journal article·2019-03-11Open access

Raman detection of hidden phonons assisted by atomic point defects in a two-dimensional semimetal

Hui Yuan, Xieyu Zhou, Yan Cao, Qi Bian, Zongyuan Zhang, Haigen Sun, Shaojian Li, Zhibin Shao, Jin Hu, Yanglin Zhu, Zhiqiang Mao, Wei Ji, Minghu Pan

Abstract

Abstract Defects usually have an important role in tailoring various properties of two-dimensional (2D) materials. However, optical detection of defects, especially single-atom point defects, is very challenging in 2D layers. Here, we report our systematic studies on the Raman-activated defect vibrational modes in 2D semimetallic material by combining Raman spectroscopy, density functional theory (DFT) calculation and scanning tunneling microscopy (STM). We observed three common Raman-active vibrational modes located at 95 ($$A1g^2$$), 228 ($$A1g^1$$), and 304 cm−1 ($$B1g^1$$) in ZrSiTe few-layers, consistent with our theoretical calculations. Moreover, a pronounced mode sitting at 131.7 cm−1 was found in the ZrSiTe monolayer. This mode fades out quickly in the bilayer (2L) and eventually disappears in 4L. The high-resolution STM images and DFT calculations suggest this mode to be an intralayer shear mode at the Brillouin zone boundary which is activated by atomic point defects, and STM-based inelastic tunneling spectrum further confirms the existence of such a defect mode. The appearance of such ‘forbidden’ modes in Raman spectra may pave an avenue for the optical characterization of single-atom point defects in metallic 2D layers.
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Research context

OpenAlex topics: 2D Materials and Applications · Topological Materials and Phenomena · Graphene research and applications

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