Scanning microscopy: New facets
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Abstract
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Research context
OpenAlex topics: Force Microscopy Techniques and Applications · Near-Field Optical Microscopy · Integrated Circuits and Semiconductor Failure Analysis
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References (1)
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1. Kim, T., Kim, D.-S., Lee, B. Y., Kim, Z. H. & Hong, S. A. "Nanoprism" Probe for Nano-optical Applications . Adv. Mater. 21, 1238 ( 2009 ). doi: 10.1002/adma.20080152810.1002/adma.200801528 ↗