journal article·2008-04-30Open access

Made to order

Authors not provided

Abstract

No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.

Source: Not provided · Quality: missing

Research context

OpenAlex topics: Surface and Thin Film Phenomena

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

References (1)

Show source-provided references
1. Luh, D. A. et al. Transition from disorder to order in thin metallic films studied with angle-resolved photoelectron spectroscopy. Phys. Rev. Lett. 100, 027603 (2008).10.1103/PhysRevLett.100.027603 ↗