Three-dimensional scanning electron microscopy used as a profilometer for the surface characterization of polyethylene-coated paperboard

Abstract In food packaging, low-density polyethylene (PE) coating is applied to paperboards to act as a functional barrier and to provide the smoothness required to enhance printability. These characteristics are related to the material’s surface roughness, the parameter monitored during the manufacturing process. Measurement of surface roughness using optical profilometry has gained importance in the paper industry. The optical instruments used to measure surface roughness are limited spatially by the relationship with the light wavelength at which they operate. A scanning electron microscope (SEM) is an alternative for overcoming the spatial resolution limitation, and the use of stereo-photogrammetry on SEM images can be seen as an alternative profilometry technique to measure surface roughness. In this investigation, the surface topography of industrially manufactured high-quality PE-coated paperboard was studied, comparing the SEM stereo-photogrammetry technique with a reference profilometry method, i. e., chromatic confocal microscopy (CCM). We found close agreement between the calculated surface roughness and the results of the techniques used and compared them according to the new ISO 25178 Geometric Product Specifications. We concluded that SEM stereo-photogrammetry provides comparable accurate alternative profilometry method for characterizing the surface roughness of PE-coated paperboard in the micrometer scale.