Semi-supervised instance segmentation algorithm based on transfer learning
Source abstract
Abstract
Semi-supervised instance segmentation algorithms are mainly divided into algorithms based on pseudo-label generation and algorithms based on transfer learning. The algorithms based on pseudo-label generation need to design a specific pseudo-label generation process, but the process is not scalable for different types of source tasks. The algorithms based on transfer learning that started late have relatively high scalability, but the algorithm research ideas are relatively simple. To expand the research on semi-supervised instance segmentation based on transfer learning, this paper proposes a feature transfer-based semi-supervised instance segmentation algorithm Feature Transfer Mask R-CNN (FT-Mask). The FT-Mask algorithm is more scalable than algorithms based on pseudo-label generation and can be used to transfer knowledge from different types of source tasks. Compared with other semi-supervised instance segmentation algorithms based on transfer learning, FT-Mask uses the feature transfer method to achieve semi-supervised instance segmentation for the first time. The experimental results show that the FT-Mask model improves the semi-supervised instance segmentation accuracy of the Mask R-CNN benchmark model through the semi-supervised learning process, and can achieve effective transfer learning.
Source: openalex_inverted_index · Quality: baseline
Research context
OpenAlex topics: Advanced Neural Network Applications · Advanced Image and Video Retrieval Techniques · Domain Adaptation and Few-Shot Learning
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
Sichuan Provincial Big Data Center, Chengdu, China
School of Computer Science, Sichuan University, Chengdu, China
Civil Aviation Logistics Technology Co. Ltd, Chengdu, China
Sichuan Great Wall Computer System Co, Luzhou, China
Funding
National Natural Science Foundation of China · Sichuan Science and Technology Program
References (36)
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