journal article·2020-07-02

Automated defect detection for fast evaluation of real inline CT scans

Maxim Schlotterbeck, Lukas Schulte, Weaam Alkhaldi, Martin Krenkel, Eno Toeppe, Stephan Tschechne, Christian Wojek

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Abstract

In this paper, we present a fully automatic evaluation approach that can be used for fast inline CT scanning. In contrast to classical defect-recognition algorithms, this approach does not require good image quality. Instead, it allows to distinguish CT artifacts from real defects introduced in the production process. To this end, a three-step workflow was developed, in which any deviations from a reference part are detected and subsequently classified and segmented, to allow automatic decision whether the part fulfills given quality requirements. We demonstrate this approach using CT scans of aluminum castings, typically used in the automotive industry. Also, a comparison between two different segmentation algorithms is shown.
Source: openalex_inverted_index · Quality: baseline

Research context

OpenAlex topics: Advanced X-ray and CT Imaging · Image and Object Detection Techniques · Industrial Vision Systems and Defect Detection

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

Institute of Materials and Joining Technology, Otto-von Guericke University, Magdeburg, Germany

Department of Application Development, Global Research & Development X-Ray, Carl Zeiss Industrielle Messtechnik GmbH, Oberkochen, Germany

Funding

Bundesministerium für Bildung und Forschung

References (8)

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