journal article·2026-06

Synchrotron-based depth-resolved residual stress evaluation with adjustable double slits: End-to-end simulations

H. Wu, J. Du, Y. Cai, D. Fan, C. Luo, M.X. Tang, X. Fang, K. Yang, Y.J. Deng, R.C. Pan, L. Lu, S.N. Luo

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OpenAlex topics: Advanced X-ray Imaging Techniques · Crystallography and Radiation Phenomena · Welding Techniques and Residual Stresses

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