Mass-produced part testing with statographs Proceedings of the 12th world conference on non-destructive testing, Amsterdam (Netherlands), 23–28 Apr. 1989, Vol. 2, pp. 1292–1297. Edited by J. Boogaard and G.M. van Dijk, Elsevier, 1989
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OpenAlex topics: Industrial Vision Systems and Defect Detection · Integrated Circuits and Semiconductor Failure Analysis
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