Detection and investigation of defects in nondestructive testing by use of Foucault (eddy) currents (In French: English Abstract)
Bibliographic record
Abstract
No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.
Source: Not provided · Quality: missing
Research context
OpenAlex topics: Non-Destructive Testing Techniques · Integrated Circuits and Semiconductor Failure Analysis · Ultrasonics and Acoustic Wave Propagation
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References
Reference metadata was not supplied for this record.