Computerized ultrasonic testing of MIC capacitors by impulse count method and image processing technique He Feng Qi. Proceedings of the 12th World Conference on Non-Destructive Testing, Amsterdam (Netherlands), 23–28 Apr. 1989, Vol. 2, pp. 1599–1601. Edited by J. Boogaard and G.M. van Dijk, Elxevier, 1989
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OpenAlex topics: Non-Destructive Testing Techniques · Ultrasonics and Acoustic Wave Propagation · High voltage insulation and dielectric phenomena
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