Evaluation of surface layer residual stresses and lattice distortions in ion implanted materials by x-ray diffraction Nondestructive characterisation of materials 2, Montreal (Canada), 21–23 Jul, 1986. pp. 595–604. Edited by J.F. Bussiere, J.P. Monchalin, C.O. Ruud, R.E. Green Jr. Plenum Press, 1987
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Research context
OpenAlex topics: Metal and Thin Film Mechanics · Advanced ceramic materials synthesis · Advanced Surface Polishing Techniques
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