X-ray residual stress analysis — the potential for locating precursors to component failures Fizer, K.W.; Lehmann, W.L.; Pardue, E.B.S. Proceedings of the 16th symposium on nondestructive evaluation, San Antonio, Texas (United States), 21–23 Apr. 1987. pp. 1–12 nondestructive testing information analysis center, Texas, USA
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OpenAlex topics: Non-Destructive Testing Techniques · Integrated Circuits and Semiconductor Failure Analysis · Electron and X-Ray Spectroscopy Techniques
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